Effective Techniques for High-Level ATPG

The ASIC design flow is rapidly moving towards higher description levels, and most design activities are now performed at the RT-level. However, test-related activities are lacking behind this trend, mainly since effective fault models and test pattern generation tools are still missing. This paper proposes techniques for implementing a high-level ATPG. The proposed algorithm mixes a code coverage-oriented approach with fault-oriented optimizations. Moreover, it exploits a fault model at the RT-level that enables efficient fault simulation and guarantees good correlation with gatelevel fault coverage. Experimental results show that the achieved results are comparable or better than those obtained at the gate level or by similar RT-level approaches.